||||The Statistical Blockade method proposed by Singhee and Rutenbar will make a significant impact on the design of next-generation digital integrated circuits. It has the potential to dramatically reduce simulation time compared to a traditional Monte Carlo ap
As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis o...
[PDF.uc19] Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering) Rating: 4.65 (659 Votes)
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You can specify the type of files you want, for your device.Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering) | Amith Singhee, Rob A. Rutenbar. I have read it a couple of times and even shared with my family members. Really good. Couldnt put it down.
