❀ Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk ❀
| #1297983 in Books | 2009-08-21 | Original language:English | PDF # 1 | 9.00 x.55 x6.00l,.70 | File Name: 0262513358 | 240 pages
||||The issue of data quality has become increasingly important over the last decade as the amount of data being collected and stored continues to increase at a rapid rate. These researchers have been at the forefront of understanding the impact and implication
All organizations today confront data quality problems, both systemic and structural. Neither ad hoc approaches nor fixes at the systems leve -- installing the latest software or developing an expensive data warehouse -- solve the basic problem of bad data quality practices. Journey to Data Quality offers a roadmap that can be used by practitioners, executives, and students for planning and implementing a viable data and information quality management program....
[PDF.ph40] Journey to Data Quality (MIT Press) Rating: 4.66 (420 Votes)
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